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The Detection of Nanoscale Membrane Bending with Polarized Localization Microscopy

机译:极化定位检测纳米膜弯曲   显微镜

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摘要

The curvature of biological membranes at the nanometer scale is criticallyimportant for vesicle trafficking, organelle morphology, and diseasepropagation. This manuscript reports the development of Polarized LocalizationMicroscopy (PLM), a pointillist optical imaging technique for the detection ofnanoscale membrane curvature in correlation with single-molecule dynamics andmolecular sorting. PLM combines polarized total internal reflectionfluorescence microscopy (TIRFM) and single-molecule localization microscopy toreveal membrane orientation with sub-diffraction-limited resolution withoutreducing localization precision by point spread function (PSF) manipulation.Further, membrane curvature detection with PLM requires fewer localizationevents to detect curvature than 3D single-molecule localization microscopy(e.g., PALM or STORM), which enables curvature detection 10x faster via PLMthan via 3D single-molecule localizations. With high sensitivity, PLM detectscurvature with provides super resolution images with >10x signal-to-noiseenhancement from diffraction-limited polarized TIRFM. With rotationallyconfined lipophilic fluorophores and the polarized incident fluorescenceexcitation, membrane-bending events are revealed with super-resolution.Engineered hemispherical membrane curvature with a radius >= 24 nm was detectedwith PLM with individual fluorophore have a localization precision of 13 +/- 5nm. Further, deciphering molecular dynamics as a function of membrane topologywas enabled. The diffusion coefficient of individual DiI molecules was 7.6xhigher in planar supported lipid bilayers than within nanoscale membranecurvature.
机译:纳米级生物膜的曲率对于囊泡运输,细胞器形态和疾病传播至关重要。这份手稿报告了偏光定位显微镜(PLM)的发展,这是一种点画法光学成像技术,用于检测与单分子动力学和分子分选相关的纳米级膜曲率。 PLM结合了偏振全内反射荧光显微镜(TIRFM)和单分子定位显微镜,可显示膜取向并具有亚衍射极限分辨率,而不会通过点扩散函数(PSF)操纵降低定位精度。此外,使用PLM进行膜曲率检测需要更少的定位事件来检测曲率比3D单分子定位显微镜(例如PALM或STORM)高,因此通过PLM进行曲率检测的速度比3D单分子定位快10倍。 PLM具有高灵敏度,可检测曲率,并提供超高分辨率图像,其衍射极限偏振TIRFM的信噪比> 10倍。旋转受限的亲脂性荧光团和偏振入射荧光激发能以超高分辨率显示膜弯曲事件。使用单个荧光团的PLM检测到半径> = 24 nm的工程半球膜曲率,定位精度为13 +/- 5nm。进一步地,使得能够根据膜拓扑来解密分子动力学。在平面支撑的脂质双层中,单个DiI分子的扩散系数比在纳米级膜曲率中的扩散系数高7.6倍。

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